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%ما هو (من)٪ 1 - تعريف
PROBE USED FOR ELECTRONIC TESTING
Test prod; Scope probe; Oscilloscope probe; Test lead; Differential probe; Near-field probe; Near field probe; Z0 probe; Zo probe; ZO probe; High voltage probe
Test probe
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
Black-eyed children
.jpg?width=200 "An artist's impression of a black-eyed child")
URBAN LEGEND
Black Eyed Kids; Black Eyed Children; Black-eyed kids
Black-eyed children or black-eyed kids are an American contemporary legend of paranormal creatures that resemble children between ages 6 and 16, with pale skin and black eyes, who are reportedly seen hitchhiking or begging, or are encountered on doorsteps of residential homes.
Kelvin probe force microscope
![The changes to the [[Fermi level]]s of the scanning Kelvin probe (SKP) sample and probe during measurement are shown. On electrical connection of the probe and sample their [[Fermi level]]s equilibrate, and a charge develops at the probe and sample. A backing potential is applied to null this charge, returning the sample Fermi level to its original position.](https://commons.wikimedia.org/wiki/Special:FilePath/SKP Fermi level diagram.png?width=200 "The changes to the [[Fermi level]]s of the scanning Kelvin probe (SKP) sample and probe during measurement are shown. On electrical connection of the probe and sample their [[Fermi level]]s equilibrate, and a charge develops at the probe and sample. A backing potential is applied to null this charge, returning the sample Fermi level to its original position.")
![A typical scanning Kelvin probe (SKP) instrument. On the left is the control unit with lock-in amplifier and backing potential controller. On the right is the x, y, z scanning axis with vibrator, [[electrometer]] and probe mounted.](https://commons.wikimedia.org/wiki/Special:FilePath/SKP Typical Instrument2.jpg?width=200 "A typical scanning Kelvin probe (SKP) instrument. On the left is the control unit with lock-in amplifier and backing potential controller. On the right is the x, y, z scanning axis with vibrator, [[electrometer]] and probe mounted.")
 Block Diagram.jpg?width=200 "Block diagram of a scanning Kelvin probe (SKP) instrument showing computer, control unit, scan axes, vibrator, probe and sample")
A NONCONTACT VARIANT OF ATOMIC FORCE MICROSCOPY
Kelvin Probe; Kelvin probe microscopy; Kelvin probe microscope; Kelvin probe force microscopy; Scanning Kelvin probe; Scanning kelvin probe; Scanning Kelvin Probe
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
ويكيبيديا
Test probe
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes. A test probe is often supplied as a test lead, which includes the probe, cable and terminating connector.
